• DocumentCode
    2339017
  • Title

    Calibration method for offset open

  • Author

    Aoki, Toshialu ; Yokoi, Katsumi

  • Author_Institution
    Measure. Stand. Centre, Yokogawa-Hewlett-Packard Ltd., Tokyo, Japan
  • fYear
    1994
  • fDate
    10-12 May 1994
  • Firstpage
    862
  • Abstract
    A new one-port impedance analyzer using a voltmeter/ammeter method has been developed for analysis of high frequency devices and materials up to 1.8 GHz. The analyzer requires a performance test periodically. One of the tests uses a 100 mm length beadless coaxial airline terminated by an offset open termination, as a one-port impedance standard. The offset open has an 8 mm length inner conductor supported by a dielectric material. This paper describes a calibration method for the offset open in the frequency range from 1 kHz to 2 GHz. The impedance of the offset open is calibrated with a precision 41 mm length coaxial beadless airline, a vector automatic network analyzer, and a 1 kHz precision capacitance bridge. Distributed resistance, inductance, and capacitance per unit length of the 41 mm length airline are derived from mechanical dimensions calibrated by Japan Quality Assurance Organization (JQA), formerly Japan Machinery and Metals Inspection Institute (JMI). As a result, the capacitance of the offset open is indirectly traceable to Japanese measurement standards
  • Keywords
    ammeters; calibration; electric impedance measurement; measurement standards; microwave measurement; surface mount technology; voltmeters; 1 kHz; 1 kHz to 2 GHz; 1.8 GHz; 100 mm; 41 mm; 8 mm; JMI; JQA; Japan Machinery and Metals Inspection Institute; Japan Quality Assurance Organization; Japanese measurement standards; beadless coaxial airline; calibration; dielectric material; distributed capacitance; distributed inductance; distributed resistance; high frequency devices; mechanical dimensions; one-port impedance analyzer; one-port impedance standard; performance test; precision capacitance bridge; surface mount devices; vector automatic network analyzer; voltmeter/ammeter; Ammeters; Calibration; Capacitance; Coaxial components; Conducting materials; Dielectric materials; Frequency; Impedance; Testing; Voltmeters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
  • Conference_Location
    Hamamatsu
  • Print_ISBN
    0-7803-1880-3
  • Type

    conf

  • DOI
    10.1109/IMTC.1994.351973
  • Filename
    351973