DocumentCode :
2339017
Title :
Calibration method for offset open
Author :
Aoki, Toshialu ; Yokoi, Katsumi
Author_Institution :
Measure. Stand. Centre, Yokogawa-Hewlett-Packard Ltd., Tokyo, Japan
fYear :
1994
fDate :
10-12 May 1994
Firstpage :
862
Abstract :
A new one-port impedance analyzer using a voltmeter/ammeter method has been developed for analysis of high frequency devices and materials up to 1.8 GHz. The analyzer requires a performance test periodically. One of the tests uses a 100 mm length beadless coaxial airline terminated by an offset open termination, as a one-port impedance standard. The offset open has an 8 mm length inner conductor supported by a dielectric material. This paper describes a calibration method for the offset open in the frequency range from 1 kHz to 2 GHz. The impedance of the offset open is calibrated with a precision 41 mm length coaxial beadless airline, a vector automatic network analyzer, and a 1 kHz precision capacitance bridge. Distributed resistance, inductance, and capacitance per unit length of the 41 mm length airline are derived from mechanical dimensions calibrated by Japan Quality Assurance Organization (JQA), formerly Japan Machinery and Metals Inspection Institute (JMI). As a result, the capacitance of the offset open is indirectly traceable to Japanese measurement standards
Keywords :
ammeters; calibration; electric impedance measurement; measurement standards; microwave measurement; surface mount technology; voltmeters; 1 kHz; 1 kHz to 2 GHz; 1.8 GHz; 100 mm; 41 mm; 8 mm; JMI; JQA; Japan Machinery and Metals Inspection Institute; Japan Quality Assurance Organization; Japanese measurement standards; beadless coaxial airline; calibration; dielectric material; distributed capacitance; distributed inductance; distributed resistance; high frequency devices; mechanical dimensions; one-port impedance analyzer; one-port impedance standard; performance test; precision capacitance bridge; surface mount devices; vector automatic network analyzer; voltmeter/ammeter; Ammeters; Calibration; Capacitance; Coaxial components; Conducting materials; Dielectric materials; Frequency; Impedance; Testing; Voltmeters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
Conference_Location :
Hamamatsu
Print_ISBN :
0-7803-1880-3
Type :
conf
DOI :
10.1109/IMTC.1994.351973
Filename :
351973
Link To Document :
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