• DocumentCode
    2339371
  • Title

    Research on Reliability Improvement of NAND Flash Memory in FAT File System

  • Author

    Zhang, Juntao ; Yao, Kun

  • Author_Institution
    Coll. of Electr. & Inf. Eng., Shaanxi Univ. of Sci. & Technol., Xi´´an, China
  • fYear
    2010
  • fDate
    23-25 April 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    NAND Flash memory is widely used in embedded products because of its large capacity and high access speed. But the reliability of NAND flash memory should be improved because of its bad blocks. Two methods for reliability improvement of NAND flash memory in FAT file system are introduced in this article, by using non-fixed storage FAT table and automatically looking-for and replacing bad blocks algorithm. These methods will shield bad blocks completely at the expense of lower write speed and have been proved efficient in embedded applications.
  • Keywords
    NAND circuits; circuit reliability; embedded systems; flash memories; FAT file system; NAND flash memory; bad blocks algorithm; embedded products; nonfixed storage FAT table; reliability improvement methods; Data engineering; Educational institutions; File systems; Flash memory; Hard disks; Power system reliability; Reliability engineering; Robustness; Storage automation; Writing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Engineering and Computer Science (ICBECS), 2010 International Conference on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-5315-3
  • Type

    conf

  • DOI
    10.1109/ICBECS.2010.5462383
  • Filename
    5462383
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2339371