Title :
Research on Reliability Improvement of NAND Flash Memory in FAT File System
Author :
Zhang, Juntao ; Yao, Kun
Author_Institution :
Coll. of Electr. & Inf. Eng., Shaanxi Univ. of Sci. & Technol., Xi´´an, China
Abstract :
NAND Flash memory is widely used in embedded products because of its large capacity and high access speed. But the reliability of NAND flash memory should be improved because of its bad blocks. Two methods for reliability improvement of NAND flash memory in FAT file system are introduced in this article, by using non-fixed storage FAT table and automatically looking-for and replacing bad blocks algorithm. These methods will shield bad blocks completely at the expense of lower write speed and have been proved efficient in embedded applications.
Keywords :
NAND circuits; circuit reliability; embedded systems; flash memories; FAT file system; NAND flash memory; bad blocks algorithm; embedded products; nonfixed storage FAT table; reliability improvement methods; Data engineering; Educational institutions; File systems; Flash memory; Hard disks; Power system reliability; Reliability engineering; Robustness; Storage automation; Writing;
Conference_Titel :
Biomedical Engineering and Computer Science (ICBECS), 2010 International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-5315-3
DOI :
10.1109/ICBECS.2010.5462383
