• DocumentCode
    2339580
  • Title

    A framework for measurement and analysis of surface defects on sphere parts

  • Author

    Zhou, Awei ; Guo, Junjie ; Li, Beizhan

  • Author_Institution
    State Key Lab. for Manuf. Syst. Eng., Xi´´an Jiaotong Univ., Xi´´an, China
  • fYear
    2012
  • fDate
    18-20 July 2012
  • Firstpage
    2127
  • Lastpage
    2130
  • Abstract
    This paper presents a measurement and analysis system of surface defects on sphere parts. The purpose of the system is a requirement to assure high quality of parts. In the system, the developed surface defect detection (SDD) system using laser and CCD camera with improved accuracy, flexibility and advanced measuring efficiency advantages, and the surface defect analysis are used to identify defects. The proposed surface defect analysis approach first uses an empirical mode decomposition (EMD)-based extracting algorithm to perform initial locating of surface defects and extract the possible defects. Then, the approach applies Canny edge algorithm to narrow down the search space of these defects, and backpropagation (BP) neural network to classify five defects with complex shapes, specifically, bulge, dent, abrasion, oxidation, and exfoliation defects. Once these defects are classified, 3D surface morphology of the extracted bulge and dent defects can be obtained and evaluated. Therefore, the system can work well for surface defects on sphere parts mentioned. Experimental results on measurement and analysis of a variety of the surface defects on sphere parts are reported to show the performance of the system.
  • Keywords
    CCD image sensors; backpropagation; inspection; neural nets; product quality; production engineering computing; surface topography measurement; 3D surface morphology; BP neural network; CCD camera; Canny edge algorithm; EMD-based extracting algorithm; SDD system; abrasion; backpropagation neural network; bulge; dent; empirical mode decomposition; exfoliation; laser camera; oxidation; sphere parts quality; surface defect analysis; surface defect detection system; surface defect location; surface defect measurement; Charge coupled devices; Feature extraction; Inspection; Measurement by laser beam; Shape measurement; Surface emitting lasers; Surface morphology; defect analysis; laser and CCD camera; measurement; sphere parts;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications (ICIEA), 2012 7th IEEE Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4577-2118-2
  • Type

    conf

  • DOI
    10.1109/ICIEA.2012.6361082
  • Filename
    6361082