• DocumentCode
    233970
  • Title

    An ABCD Parameter Based Modeling and Analysis of Crosstalk Induced Effects in Multiwalled Carbon Nanotube Bundle Interconnects

  • Author

    Sahoo, Manodipan ; Ghosal, P. ; Rahaman, Hafizur

  • Author_Institution
    Dept. of Inf. Technol., Bengal Eng. & Sci. Univ., Howrah, India
  • fYear
    2014
  • fDate
    5-9 Jan. 2014
  • Firstpage
    433
  • Lastpage
    438
  • Abstract
    Cross talk effects in large diameter Multiwalled Carbon Nanotube bundle interconnects (MWCNTs) for the future nanoscale integrated circuits are investigated with the help of ABCD parameter matrix approach for intermediate and global interconnects at 22 nm and 14 nm technology nodes. Here, isolated MWCNTs are modeled using an equivalent single conductor transmission line. Simulation results show that the proposed model matches very well with the SPICE model available in literatures. The worst case cross talk induced delay and peak cross talk noise voltages for MWCNT bundle interconnects are derived and compared to those of conventional copper interconnects. The worst case cross talk delays for MWCNT bundle interconnects are less than 15% of that of copper interconnects for 1 mm long intermediate and less than 20% of that of copper interconnects for 2 mm long global interconnects for both the technology nodes. The ratio of peak cross talk noise voltage of MWCNT bundles to that of Copper is seen to decrease in scaled technology. We have compared our cross talk analysis results with the earlier work to verify the validity of our proposed model and observed that the results with our model are in good agreement with the existing work. Finally, our analysis shows that from the signal integrity perspective, large diameter MWCNT bundles are a very good alternative to copper interconnects for future Integrated circuit technology generations.
  • Keywords
    carbon nanotubes; copper; crosstalk; equivalent circuits; integrated circuit interconnections; integrated circuit modelling; integrated circuit noise; transmission lines; ABCD parameter based modeling; C; Cu; SPICE model; copper interconnects; crosstalk induced delay; equivalent single conductor transmission line; integrated circuit technology; multiwalled carbon nanotube bundle interconnects; peak crosstalk noise voltages; Capacitance; Copper; Crosstalk; Delays; Integrated circuit interconnections; Integrated circuit modeling; SPICE; ABCD parameter; Crosstalk; Delay; Integrated Circuit; Interconnects; Multiwalled Carbon Nanotube (MWCNT); Nanoscale; Noise; SPICE;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design and 2014 13th International Conference on Embedded Systems, 2014 27th International Conference on
  • Conference_Location
    Mumbai
  • ISSN
    1063-9667
  • Type

    conf

  • DOI
    10.1109/VLSID.2014.81
  • Filename
    6733170