DocumentCode :
2339781
Title :
Analysis of waveguides structures using 3-D reduction meshing applied in Finite-Element Time-Domain (RM-FETD)
Author :
Ali, Adel Ben ; Gharsallah, Ali
Author_Institution :
Dept. de Phys., Unite de Rech. Circuits et Syst. d´´Electron. Haute Frequence, Tunis
fYear :
2008
fDate :
7-9 Nov. 2008
Firstpage :
1
Lastpage :
6
Abstract :
This paper present the solution of the vector wave equation by a discrete time domain finite element method, based on the New Reduction meshing in three dimension RM-FETD (reduction meshing-finite element time domain). These techniques allow obtaining a fully explicit time integration procedure. The sampling rate of the time domain waveform is governed by the Nyquist rate of the Gaussian test signal instead of the carrier signal in the unconditionally stable RM-FETD method. Compared to the traditional FETD, the cost can be dramatically reduced when the test signal and carrier ratio is very small. This technique is implemented to solve a microwave guided structures. Numerical formulations are presented and simulations are compared with the normalize simulator.
Keywords :
finite element analysis; time-domain analysis; waveguide theory; waveguides; 3D reduction meshing; Gaussian test signal; Nyquist rate; carrier signal; discrete time domain finite element method; microwave guided structures; reduction meshing-finite element time domain; sampling rate; time domain waveform; waveguides structure analysis; Circuit analysis; Circuits and systems; Computational modeling; Finite element methods; Frequency; Microwave theory and techniques; Partial differential equations; Testing; Time domain analysis; Transmission line matrix methods; 3-D FETD; Reduction Meshing; edge element; waveguide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signals, Circuits and Systems, 2008. SCS 2008. 2nd International Conference on
Conference_Location :
Monastir
Print_ISBN :
978-1-4244-2627-0
Electronic_ISBN :
978-1-4244-2628-7
Type :
conf
DOI :
10.1109/ICSCS.2008.4746887
Filename :
4746887
Link To Document :
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