• DocumentCode
    2339781
  • Title

    Analysis of waveguides structures using 3-D reduction meshing applied in Finite-Element Time-Domain (RM-FETD)

  • Author

    Ali, Adel Ben ; Gharsallah, Ali

  • Author_Institution
    Dept. de Phys., Unite de Rech. Circuits et Syst. d´´Electron. Haute Frequence, Tunis
  • fYear
    2008
  • fDate
    7-9 Nov. 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper present the solution of the vector wave equation by a discrete time domain finite element method, based on the New Reduction meshing in three dimension RM-FETD (reduction meshing-finite element time domain). These techniques allow obtaining a fully explicit time integration procedure. The sampling rate of the time domain waveform is governed by the Nyquist rate of the Gaussian test signal instead of the carrier signal in the unconditionally stable RM-FETD method. Compared to the traditional FETD, the cost can be dramatically reduced when the test signal and carrier ratio is very small. This technique is implemented to solve a microwave guided structures. Numerical formulations are presented and simulations are compared with the normalize simulator.
  • Keywords
    finite element analysis; time-domain analysis; waveguide theory; waveguides; 3D reduction meshing; Gaussian test signal; Nyquist rate; carrier signal; discrete time domain finite element method; microwave guided structures; reduction meshing-finite element time domain; sampling rate; time domain waveform; waveguides structure analysis; Circuit analysis; Circuits and systems; Computational modeling; Finite element methods; Frequency; Microwave theory and techniques; Partial differential equations; Testing; Time domain analysis; Transmission line matrix methods; 3-D FETD; Reduction Meshing; edge element; waveguide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signals, Circuits and Systems, 2008. SCS 2008. 2nd International Conference on
  • Conference_Location
    Monastir
  • Print_ISBN
    978-1-4244-2627-0
  • Electronic_ISBN
    978-1-4244-2628-7
  • Type

    conf

  • DOI
    10.1109/ICSCS.2008.4746887
  • Filename
    4746887