DocumentCode :
2340181
Title :
Conductor protection against short circuit current: available I*2t evaluation
Author :
Parise, Giuseppe ; Adduce, Marina
Author_Institution :
Dept. of Electr. Eng., Rome Univ., Italy
Volume :
3
fYear :
1998
fDate :
12-15 Oct. 1998
Firstpage :
2336
Abstract :
The admissible let-through energy I/sup 2/t allows consideration of the cable protection from overheating due to excessive short circuit current flowing in its conductors. For short circuit current duration of t<0.1 s, which is a range own for instantaneous tripping of protective devices in electric power systems below 600 V AC, the asymmetry of the current is of importance in the evaluation of the through energy. The IEC Standard suggests that the value of I/sup 2/t should be quoted by the manufacturer of the adopted protective devices. In the case of very short duration less than half-cycle, for which it is necessary to consider the protective device I/sup 2/t limiting behavior. The aim of this paper is to free the designer from the necessary knowledge of protective device behavior or from the need of prior manufacturers choice. The paper suggests evaluation of the prospective Joule integral, always referred to as RMS short circuit current by means a factor m, which considers the worst case (maximum value). Expressions and illustrations are given for m factor evaluation, which is variable with fault circuit conditions and prospective short circuit duration.
Keywords :
power cables; power system protection; short-circuit currents; IEC Standard; RMS short circuit current; admissible let-through energy; available I*/sup 2/t evaluation; cable overheating protection; conductor protection; prospective Joule integral; protective devices tripping; short circuit current duration; short circuit current protection; Aluminum; Circuit faults; Conducting materials; Conductors; Copper; IEC standards; Power system protection; Short circuit currents; Temperature dependence; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 1998. Thirty-Third IAS Annual Meeting. The 1998 IEEE
Conference_Location :
St. Louis, MO, USA
ISSN :
0197-2618
Print_ISBN :
0-7803-4943-1
Type :
conf
DOI :
10.1109/IAS.1998.730140
Filename :
730140
Link To Document :
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