• DocumentCode
    2340181
  • Title

    Conductor protection against short circuit current: available I*2t evaluation

  • Author

    Parise, Giuseppe ; Adduce, Marina

  • Author_Institution
    Dept. of Electr. Eng., Rome Univ., Italy
  • Volume
    3
  • fYear
    1998
  • fDate
    12-15 Oct. 1998
  • Firstpage
    2336
  • Abstract
    The admissible let-through energy I/sup 2/t allows consideration of the cable protection from overheating due to excessive short circuit current flowing in its conductors. For short circuit current duration of t<0.1 s, which is a range own for instantaneous tripping of protective devices in electric power systems below 600 V AC, the asymmetry of the current is of importance in the evaluation of the through energy. The IEC Standard suggests that the value of I/sup 2/t should be quoted by the manufacturer of the adopted protective devices. In the case of very short duration less than half-cycle, for which it is necessary to consider the protective device I/sup 2/t limiting behavior. The aim of this paper is to free the designer from the necessary knowledge of protective device behavior or from the need of prior manufacturers choice. The paper suggests evaluation of the prospective Joule integral, always referred to as RMS short circuit current by means a factor m, which considers the worst case (maximum value). Expressions and illustrations are given for m factor evaluation, which is variable with fault circuit conditions and prospective short circuit duration.
  • Keywords
    power cables; power system protection; short-circuit currents; IEC Standard; RMS short circuit current; admissible let-through energy; available I*/sup 2/t evaluation; cable overheating protection; conductor protection; prospective Joule integral; protective devices tripping; short circuit current duration; short circuit current protection; Aluminum; Circuit faults; Conducting materials; Conductors; Copper; IEC standards; Power system protection; Short circuit currents; Temperature dependence; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 1998. Thirty-Third IAS Annual Meeting. The 1998 IEEE
  • Conference_Location
    St. Louis, MO, USA
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-4943-1
  • Type

    conf

  • DOI
    10.1109/IAS.1998.730140
  • Filename
    730140