• DocumentCode
    2340291
  • Title

    Asymptotically optimal model selection and neural nets

  • Author

    Barron, Andrew R.

  • Author_Institution
    Dept. of Stat., Yale Univ., New Haven, CT, USA
  • fYear
    1994
  • fDate
    27-29 Oct 1994
  • Firstpage
    35
  • Abstract
    A minimum description length criterion for inference of functions in both parametric and nonparametric settings is determined. By adapting the parameter precision, a description length criterion can take on the form log(likelihood)+const·m instead of the familiar -log(likelihood)+(m/2)log n where m is the number of parameters and n is the sample size. For certain regular models the criterion yields asymptotically optimal rates for coding redundancy and statistical risk. Moreover, the convergence is adaptive in the sense that the rates are simultaneously minimax optimal in various parametric and nonparametric function classes without prior knowledge of which function class contains the true function. This one criterion combines positive benefits of information-theoretic criteria proposed by Rissanen, Akaike, and Schwarz. A reviewed is also includes of how the minimum description length principle provides accurate estimates in irregular models such as neural nets
  • Keywords
    convergence of numerical methods; encoding; neural nets; nonparametric statistics; parameter estimation; statistical analysis; asymptotically optimal model selection; asymptotically optimal rates; coding redundancy; information-theoretic criteria; irregular models; minimax optimal convergence rates; minimum description length criterion; neural nets; nonparametric function; parameter precision; parametric function; regular models; statistical risk; Convergence; Data compression; Decoding; Euclidean distance; Microwave integrated circuits; Minimax techniques; Neural networks; Parametric statistics; Polynomials; Redundancy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory and Statistics, 1994. Proceedings., 1994 IEEE-IMS Workshop on
  • Conference_Location
    Alexandria, VA
  • Print_ISBN
    0-7803-2761-6
  • Type

    conf

  • DOI
    10.1109/WITS.1994.513871
  • Filename
    513871