Title : 
Al-DyxOy-n-InP (100) structure preparation and properties
         
        
            Author : 
Babushkina, N.V. ; Malyshev, S.A. ; Romanova, L.I.
         
        
            Author_Institution : 
Inst. of Electron., Acad. of Sci., Minsk, Byelorussia
         
        
        
        
        
        
            Abstract : 
Al-DyxOy-n-InP structures with dysprosium oxide film prepared by two different methods have been studied. The Dy xOy films with 40-120 nm thickness have obtained by Dy thermal evaporation in the O2 environment (I) or in the vacuum (II) followed by thermal oxidation at 330-350°C in a dry oxygen stream. It follows for analysis of the experiments that the breakdown field in the Al-DyxOy(I)-n-InP structure Ebr is 2.5×106 V/cm, the effective positive surface charge Qss is ~3×1011 cm-2 and the surface state density Nit is 5×1011 cm-2 eV-1. The C-V characteristics hysteresis is of injection type with the magnitude less than 0.3 V. The Al-DyxOy (II)-n-InP structure has surface charge magnitude Qss about ±1×1011  cm-2 surface state density Nit~1×10 11 cm-2 eV-1, ionic type hysteresis 1-3 V and Ebr~5×106
         
        
            Keywords : 
III-V semiconductors; MIS structures; aluminium; dysprosium compounds; electric breakdown; indium compounds; oxidation; surface states; vacuum deposited coatings; Al-DyxOy-n-InP (100) structure; Al-DyO-InP; C-V characteristics; breakdown field; dysprosium oxide film; hysteresis; surface charge; surface state density; thermal evaporation; thermal oxidation; Cameras; Dielectric losses; Dielectrics and electrical insulation; Electric breakdown; Hysteresis; Indium phosphide; Mercury (metals); Oxidation; Permittivity; Semiconductor films;
         
        
        
        
            Conference_Titel : 
Advanced Semiconductor Devices and Microsystems, 1998. ASDAM '98. Second International Conference on
         
        
            Conference_Location : 
Smolenice Castle
         
        
            Print_ISBN : 
0-7803-4909-1
         
        
        
            DOI : 
10.1109/ASDAM.1998.730174