DocumentCode :
2341297
Title :
A novel forecasting model of contaminated insulator flashover voltage
Author :
Jianyuan, Xu ; Yun, Teng ; Xin, Lin
Author_Institution :
Sch. of Electr. Eng., Shenyang Univ. of Technol., Shenyang, China
fYear :
2009
fDate :
25-27 May 2009
Firstpage :
2976
Lastpage :
2980
Abstract :
To solve the problem of the selecting of the external insulation under complex circumstance conditions, a flashover voltage forecasting model of contaminated insulators based on double ANNs is proposed in the paper. The equivalent salt deposit density (ESDD) is the key of flashover voltage on contaminated insulator, and circumstance conditions are also great influence on it. The equivalent salt deposit density (ESDD) value of insulator can be treated as a nonlinear time series and be forecasted by the nonlinear time series ANNs model. The flashover voltage forecasting model consists of two artificial neural networks. The first is used to forecast the equivalent salt deposit density (ESDD) time series and the second is employed to calculate the withstand voltage of insulator. A series of artificial pollution tests show that the results of the forecasting model is acceptable in engineering application.
Keywords :
insulator contamination; neural nets; power engineering computing; time series; artificial neural networks; artificial pollution tests; contaminated insulator flashover voltage; equivalent salt deposit density; flashover voltage forecasting model; nonlinear time series ANN model; Artificial neural networks; Atmospheric modeling; Dielectrics and electrical insulation; Flashover; Pollution; Power system modeling; Power system reliability; Predictive models; Voltage; Weather forecasting; comtaminated flashover; double ANNs; flashover voltage forecasting; nonlinear time series;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics and Applications, 2009. ICIEA 2009. 4th IEEE Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-2799-4
Electronic_ISBN :
978-1-4244-2800-7
Type :
conf
DOI :
10.1109/ICIEA.2009.5138754
Filename :
5138754
Link To Document :
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