Title :
New method of surface barrier structures characterization using plasmon-polariton photoeffect
Author :
Dmitruk, N.L. ; Mayeva, O.I. ; Mamykin, S.V. ; Yastrubchak, O.B.
Author_Institution :
Inst. of Phys. of Semicond., Acad. of Sci., Kiev, Ukraine
Abstract :
The new method of characterization of Schottky barrier surface polariton (SP waves based photodetectors is presented and its very promising ability of optimization of their parameters (diffusion length, Schottky barrier height electron and hole emission rates and surface recombination velocity, etc.) is shown
Keywords :
Schottky barriers; photodetectors; polaritons; surface plasmons; Schottky barrier height; Schottky barrier surface polariton wave photodetector; diffusion length; electron emission rate; hole emission rate; plasmon-polariton photoeffect; surface barrier structure; surface recombination velocity; Charge carrier processes; Corrugated surfaces; Gratings; Optical films; Optical surface waves; Photodetectors; Plasmons; Resonance; Schottky barriers; Surface waves;
Conference_Titel :
Advanced Semiconductor Devices and Microsystems, 1998. ASDAM '98. Second International Conference on
Conference_Location :
Smolenice Castle
Print_ISBN :
0-7803-4909-1
DOI :
10.1109/ASDAM.1998.730201
