DocumentCode :
2341578
Title :
Non-parametric calibration of a time domain reflectometer
Author :
Boets, Patrick ; Van Biesen, L.
Author_Institution :
Dept. of Fundamental Electr. & Instrum., Vrije Univ., Brussels, Belgium
fYear :
1994
fDate :
10-12 May 1994
Firstpage :
114
Abstract :
The non-parametric calibration procedure consists in finding the scattering parameters of the line network that connects the reflectometer and the device under test. The scattering parameters are determined by using the S11 measurement of the connection cable terminated with three different loads (open, short and load). Since commercial reflectometers digitize only voltages, one has to extent the hardware so that it becomes possible to measure currents. A current to voltage transducer will be applied. This transducer will be parametric calibrated. For each load, the voltage and current reflectogram will be measured and transformed to the frequency domain where the S11 equivalent can be calculated. The corrected voltage reflectogram can be obtained through convolution of the excitation pulse with the time domain representation of S11. Due to the limited energy at high frequencies of the pulse-like excitation signals, one has to apply a deconvolution technique to visualize the time domain representation of the S11 measurement
Keywords :
S-parameters; calibration; electric connectors; electric current measurement; fault location; frequency-domain analysis; multiport networks; time-domain reflectometry; transducers; voltage measurement; S11 measurement; connection cable; convolution; corrected voltage reflectogram; current to voltage transducer; deconvolution technique; excitation pulse; line network; nonparametric calibration; scattering parameters; time domain reflectometer; time domain representation; Calibration; Current measurement; Frequency domain analysis; Frequency measurement; Hardware; Pulse measurements; Scattering parameters; Testing; Transducers; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
Conference_Location :
Hamamatsu
Print_ISBN :
0-7803-1880-3
Type :
conf
DOI :
10.1109/IMTC.1994.352113
Filename :
352113
Link To Document :
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