DocumentCode :
2341680
Title :
Automated metrics for industrial applications software polymorphic interactions
Author :
Zhou Hang ; Huang Zhi-Qiu ; Wang Li ; Chen Liang
Author_Institution :
Inf. Sci. & Technol. Inst., Nanjing Univ. of Aeronaut. & Astronaut. & Command, Nanjing
fYear :
2008
fDate :
3-5 June 2008
Firstpage :
477
Lastpage :
482
Abstract :
Industrial designer pressure to get their applications software more quickly and higher quality. Unified Modeling Language has been a software modeling standard. Sequence diagrams of UML can not describe the polymorphism, which leads to lack sequence diagram metrics to guide the polymorphism methods test cases generation. An approach is proposed to formalize polymorphism sequence diagrams and generate test case. According to class constraints and Satisfying Set rules, the approach got the Class Sets of Polymorphism Methods. The approach transformed sequence diagrams into the Polymorphism Class Object Method Acyclic Graph. Utilizing the Depth First Search, the approach automatically generated sequence diagram test cases. The approach availability was verified by an example analysis. The results show that the approach can measure the polymorphic methods and generate sequence diagram test cases to test polymorphism methods. It can enhance the coverage of tests.
Keywords :
Unified Modeling Language; graph theory; industrial engineering; object-oriented programming; program testing; software maintenance; software metrics; software quality; tree searching; UML sequence diagram; Unified Modeling Language; automated software metrics; class constraint; depth first search; industrial applications software polymorphic interaction; polymorphism class object method acyclic graph; polymorphism method test case generation; satisfying set rule; software maintenance; software modeling standard; software quality; Application software; Computer industry; Extraterrestrial measurements; Information science; Object oriented modeling; Software maintenance; Software measurement; Space technology; Testing; Unified modeling language;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics and Applications, 2008. ICIEA 2008. 3rd IEEE Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-1717-9
Electronic_ISBN :
978-1-4244-1718-6
Type :
conf
DOI :
10.1109/ICIEA.2008.4582561
Filename :
4582561
Link To Document :
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