• DocumentCode
    2342000
  • Title

    Active voltage sharing of series connected strings of IGBT devices in bridge applications

  • Author

    Belverde, G. ; Galluzzo, A. ; Melito, M. ; Musumeci, S. ; Raciti, A.

  • Author_Institution
    ST Microelectron., Catania, Italy
  • Volume
    2
  • fYear
    1998
  • fDate
    12-15 Oct. 1998
  • Firstpage
    817
  • Abstract
    The successful use of series connected strings of MOSFETs or IGBTs, requires equalizing the dynamic and static voltage sharing across the devices. The dynamic voltage imbalance is generally managed via the slope control of the output voltages by snubber capacitors, or by active balancing circuits on the gate side. In this paper, a novel approach, based on the control of the currents supplied to the gates, is proposed. The main issues related to the application in bridge configuration of series connected strings of devices are faced. Firstly, the voltage sensing circuit is analyzed in order to meet the needs of bridge circuits. Experimental tests are performed in order to evaluate the impact of the actual control actions on the devices. Advantages and disadvantages of the proposed active voltage sharing circuit are treated extensively, in order to give also experimental evidence to the switching power losses in comparison with conventional approaches.
  • Keywords
    bridge circuits; insulated gate bipolar transistors; power bipolar transistors; semiconductor device measurement; semiconductor device models; semiconductor device testing; voltage measurement; active voltage sharing; bridge applications; dynamic voltage imbalance; gate current control; series-connected IGBT strings; switching power losses; voltage sensing circuit; Bridge circuits; Capacitors; Circuit analysis; Circuit testing; Current supplies; Insulated gate bipolar transistors; MOSFETs; Performance evaluation; Snubbers; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 1998. Thirty-Third IAS Annual Meeting. The 1998 IEEE
  • Conference_Location
    St. Louis, MO, USA
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-4943-1
  • Type

    conf

  • DOI
    10.1109/IAS.1998.730240
  • Filename
    730240