Title :
On-line estimation of IGBT junction temperature using on-state voltage drop
Author :
Kim, Yong-Seok ; Sul, Seung-Ki
Author_Institution :
Sch. of Electr. Eng., Seoul Nat. Univ., South Korea
Abstract :
In this paper, a noninvasive and accurate on-line estimation method for IGBT junction temperature is proposed. To optimize the heat management of IGBTs, it provides accurate information about junction temperature. The proposed method requires a few additional passive circuit components for the estimation and it can be easily incorporated into the conventional gate driver circuit. The proposed method consists of two processes, one is off-line characterization of the IGBT under test and the other one is on-line estimation of junction temperature based on the characterized data. The simulation and experimental results confirm the validity of the proposed estimation method.
Keywords :
insulated gate bipolar transistors; p-n junctions; parameter estimation; IGBT junction temperature; gate driver circuit; heat management; noninvasive on-line estimation method; on-line estimation; on-state voltage drop; passive circuit components; Circuit testing; Driver circuits; Heat sinks; Insulated gate bipolar transistors; Passive circuits; Power electronics; Power system reliability; Temperature sensors; Thermal sensors; Voltage;
Conference_Titel :
Industry Applications Conference, 1998. Thirty-Third IAS Annual Meeting. The 1998 IEEE
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-4943-1
DOI :
10.1109/IAS.1998.730245
