Application of scanning tunneling microscope to high-speed optical sampling measurement

Author

Takeuchi, Koichiro ; Kasahara, Yukio

Author_Institution

Teratec Corp., Tokyo, Japan

fYear

1994

fDate

10-12 May 1994

Firstpage

1415

Abstract

A novel method for a measurement of a high-speed electrical waveform using a scanning tunneling microscope (STM) is demonstrated. An optical pulse train is used to turn on and off the photo-conductive switch on the STM probe to measure a high-speed signal in an equivalent sampling procedure. The temporal resolution of 160 ps has been achieved. This method has the potential to create a breakthrough in ultra high-speed waveform measurement through this unique combination of optical sampling and STM technology

Keywords

circuit testing; electro-optical devices; electronic equipment testing; photoconducting switches; scanning tunnelling microscopy; signal sampling; waveform analysis; STM; STM probe; equivalent sampling; high-speed electrical waveform; high-speed optical sampling measurement; high-speed signal; optical pulse train; photoconductive switch; scanning tunneling microscope; temporal resolution; ultra high-speed waveform measurement; Electric variables measurement; High speed optical techniques; Optical microscopy; Optical pulses; Optical switches; Probes; Pulse measurements; Sampling methods; Signal resolution; Tunneling;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE

Conference_Location

Hamamatsu

Print_ISBN

0-7803-1880-3

Type

conf

DOI

10.1109/IMTC.1994.352161

Filename

352161