DocumentCode :
2342289
Title :
Scanning force microscopy and magnetic force microscopy imaging of the surface structure of a large capacity floppy disk
Author :
Masai, Junji ; Seo, Yuzo ; Sasaki, Ken Ichiro ; Yoshiyama, Ryuichi ; Shitbata-Seki, T. ; Kuriyama, Toshihiko ; Yamauchi, Hiromi
Author_Institution :
Res. Center, Mitsubishi Kasei Corp., Yokohama, Japan
fYear :
1994
fDate :
10-12 May 1994
Firstpage :
1423
Abstract :
Simultaneous scanning force microscopy (SFM) and magnetic force microscopy (MFM) observation of the surface topography and magnetic bit patterns (track width of 9 μm and shortest bit-length of 0.75 μm) at the same small surface region of a large capacity floppy disk (100 Mbyte on a 3.5-inch disk) is shown. It is revealed that irregular distributions of hexagonal platelet Ba-ferrite fine magnetic particles (50 nm diameter and 20 nm thickness) and abrasive aluminum particles on the surface are major causes of nonuniformity in the magnetic force gradient map of the MFM image. A brief description of the disk drive and some characteristic readout data are also given
Keywords :
aluminium; atomic force microscopy; barium compounds; floppy discs; magnetic force microscopy; magnetic variables measurement; surface topography measurement; 0.75 mum; 100 MByte; 3.5 in; 9 mum; Al; Ba-ferrite fine magnetic particles; MFM image; SFM; abrasive aluminum particles; characteristic readout data; disk drive; hexagonal platelet; irregular distributions; large capacity floppy disk; magnetic bit patterns; magnetic force gradient map; magnetic force microscopy imaging; nonuniformity; scanning force microscopy; surface structure; surface topography; Inspection; Magnetic field measurement; Magnetic force microscopy; Magnetic forces; Magnetic recording; Scanning electron microscopy; Surface morphology; Surface structures; Surface topography; Transmission electron microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
Conference_Location :
Hamamatsu
Print_ISBN :
0-7803-1880-3
Type :
conf
DOI :
10.1109/IMTC.1994.352163
Filename :
352163
Link To Document :
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