• DocumentCode
    2342294
  • Title

    Influence of collector design on InGaP/GaAs HBT linearity

  • Author

    Iwamoto, M. ; Low, T.S. ; Hutchinson, C.P. ; Scott, J.B. ; Cognata, A. ; Xiaohui Qin ; Camnitz, L.H. ; Asbeck, P.M. ; D´Avanzo, D.C.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., San Diego, La Jolla, CA, USA
  • Volume
    2
  • fYear
    2000
  • fDate
    11-16 June 2000
  • Firstpage
    757
  • Abstract
    Linearity characteristics of InGaP/GaAs heterojunction bipolar transistors with various collector profiles are examined. Output third-order intercept point is measured as a function of bias current and voltage at 5 GHz. The results from this study indicate that IP3 varies with current in a complex manner and is significantly dependent on the collector design. A dynamic trend in IP3 is observed where a peak occurs at a current just below Kirk effect and a trough occurs at the onset of Kirk effect. Although the Gummel-Poon model is not able to predict this behavior, a large signal HBT model, which accounts for collector space-charge effects such as electron velocity modulation and Kirk effect, can properly represent the measured data. For accurate linearity predictions, these effects should be included in a large signal HBT model.
  • Keywords
    III-V semiconductors; gallium arsenide; gallium compounds; heterojunction bipolar transistors; indium compounds; intermodulation; semiconductor device models; 5 GHz; Gummel-Poon model; IP3; InGaP-GaAs; InGaP/GaAs heterojunction bipolar transistor; Kirk effect; collector design; electron velocity modulation; intermodulation; large-signal model; linearity; space charge; third-order intercept point; Current measurement; Doping; Electrical resistance measurement; Electrons; Gallium arsenide; Heterojunction bipolar transistors; Kirk field collapse effect; Linearity; Predictive models; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest. 2000 IEEE MTT-S International
  • Conference_Location
    Boston, MA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-5687-X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2000.863292
  • Filename
    863292