Title :
On bounded plasma diagnostics
Author :
Temko, S.W. ; Temko, K.W. ; Kuzmin, S.K.
Abstract :
Summary form only given. We consider bounded plasmas with impurities and its environment. The bounded plasma with impurities is an ionized cloud. The cloud is formed under the action of outer, inner and surface forces, which are connected with each other. We consider only small perturbations. A double layer on the surface of the cloud is formed. Impurities of large-size particles, resulting from the influence of adhesion and coagulation. To precipitate impurities one can use ultrasonic coagulation. However under the action of ultrasonics turbulence arises and instabilities, disturbing the plasma state, can develop. To stabilize the plasma state and to deposit impurities on the walls or gas-discharge camera one needs both the data on the diagnostics and the result of calculations as well as the system of adaptive control. Adaptation of control is guaranteed by feedback. To improve reliability and refusal-stability of the control system an apparatus, program and time excessiveness are used. Effective diagnostic methods are SHF-methods and laser diagnostics. We also use random walks method and a computer experiment. To examine physical and physical-chemical properties of the bounded plasma cloud we solve a self-consistent problem. To find the optimal calculating data we apply non-linear statistical thermodynamics of spatial clusters.
Keywords :
plasma diagnostics; plasma impurities; plasma sheaths; plasma thermodynamics; SHF-methods; adaptive control; adhesion; bounded plasma diagnostics; coagulation; computer experiment; double layer; gas-discharge camera; impurities; inner forces; instabilities; ionized cloud; large-size particles; laser diagnostics; nonlinear statistical thermodynamics; outer forces; physical-chemical properties; plasma state; random walks; spatial clusters; surface forces; ultrasonic coagulation; ultrasonics turbulence; Adaptive control; Adhesives; Cameras; Clouds; Coagulation; Control systems; Impurities; Laser feedback; Plasma diagnostics; Plasma properties;
Conference_Titel :
Plasma Science, 1995. IEEE Conference Record - Abstracts., 1995 IEEE International Conference on
Conference_Location :
Madison, WI, USA
Print_ISBN :
0-7803-2669-5
DOI :
10.1109/PLASMA.1995.532809