DocumentCode
2342464
Title
A new MEMS-based piezoresistive micro-displacement sensor with high resolution
Author
Shao Bing ; Guo Bin ; Liguo, C. ; Rong Weibin
Author_Institution
Sch. of Mater. Sci. & Eng., Harbin Inst. of Technol., Harbin
fYear
2009
fDate
25-27 May 2009
Firstpage
3272
Lastpage
3276
Abstract
This paper describes a miniature MEMS-based piezoresistive displacement sensor with micrometric range and nanometric resolution. This kind of sensor should be integrated in a precision positioning mechanism (PPM) able to make accurate micro/nano-positioning tasks. We firstly provide a overview of the MEMS-based piezoresistive sensor principle. The theoretical modeling, dimension analysis and stress simulation of the sensor are carried out subsequently. Furthermore, the geometrical parameters of piezoresistance are designed and the main MEMS process of the sensor is developed. Finally, the experimental results are very good and the mini-sensor is able to measure a displacement with a 5 nm resolution over a 10mum range.
Keywords
displacement measurement; microsensors; piezoresistive devices; position measurement; MEMS-based piezoresistive sensor; microdisplacement sensor; micrometric range; nanometric resolution; precision positioning mechanism; Analytical models; Force sensors; Magnetic sensors; Materials science and technology; Mechanical sensors; Micromechanical devices; Piezoresistance; Sensor phenomena and characterization; Silicon; Stress; MEMS; PPM; piezoresistive displacement sensor;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics and Applications, 2009. ICIEA 2009. 4th IEEE Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4244-2799-4
Electronic_ISBN
978-1-4244-2800-7
Type
conf
DOI
10.1109/ICIEA.2009.5138807
Filename
5138807
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