• DocumentCode
    2342464
  • Title

    A new MEMS-based piezoresistive micro-displacement sensor with high resolution

  • Author

    Shao Bing ; Guo Bin ; Liguo, C. ; Rong Weibin

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Harbin Inst. of Technol., Harbin
  • fYear
    2009
  • fDate
    25-27 May 2009
  • Firstpage
    3272
  • Lastpage
    3276
  • Abstract
    This paper describes a miniature MEMS-based piezoresistive displacement sensor with micrometric range and nanometric resolution. This kind of sensor should be integrated in a precision positioning mechanism (PPM) able to make accurate micro/nano-positioning tasks. We firstly provide a overview of the MEMS-based piezoresistive sensor principle. The theoretical modeling, dimension analysis and stress simulation of the sensor are carried out subsequently. Furthermore, the geometrical parameters of piezoresistance are designed and the main MEMS process of the sensor is developed. Finally, the experimental results are very good and the mini-sensor is able to measure a displacement with a 5 nm resolution over a 10mum range.
  • Keywords
    displacement measurement; microsensors; piezoresistive devices; position measurement; MEMS-based piezoresistive sensor; microdisplacement sensor; micrometric range; nanometric resolution; precision positioning mechanism; Analytical models; Force sensors; Magnetic sensors; Materials science and technology; Mechanical sensors; Micromechanical devices; Piezoresistance; Sensor phenomena and characterization; Silicon; Stress; MEMS; PPM; piezoresistive displacement sensor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications, 2009. ICIEA 2009. 4th IEEE Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4244-2799-4
  • Electronic_ISBN
    978-1-4244-2800-7
  • Type

    conf

  • DOI
    10.1109/ICIEA.2009.5138807
  • Filename
    5138807