Title :
The current logic VLSI test system and trend
Author_Institution :
Ando Electr. Co. Ltd., Tokyo, Japan
Abstract :
This paper describes the tester architecture, the specifications and the functions of a current logic tester. The history of logic testers and their general technical issues are also provided in this paper
Keywords :
VLSI; automatic test software; automatic testing; logic testing; IDDQ tester; logic VLSI test; pattern generator; specifications; tester architecture; tester software; timing generator; Calibration; Hardware; History; Logic devices; Logic testing; Pins; System testing; Test pattern generators; Timing; Very large scale integration;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
Conference_Location :
Hamamatsu
Print_ISBN :
0-7803-1880-3
DOI :
10.1109/IMTC.1994.352175