DocumentCode :
2342480
Title :
The current logic VLSI test system and trend
Author :
Hara, Akinori
Author_Institution :
Ando Electr. Co. Ltd., Tokyo, Japan
fYear :
1994
fDate :
10-12 May 1994
Firstpage :
1472
Abstract :
This paper describes the tester architecture, the specifications and the functions of a current logic tester. The history of logic testers and their general technical issues are also provided in this paper
Keywords :
VLSI; automatic test software; automatic testing; logic testing; IDDQ tester; logic VLSI test; pattern generator; specifications; tester architecture; tester software; timing generator; Calibration; Hardware; History; Logic devices; Logic testing; Pins; System testing; Test pattern generators; Timing; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
Conference_Location :
Hamamatsu
Print_ISBN :
0-7803-1880-3
Type :
conf
DOI :
10.1109/IMTC.1994.352175
Filename :
352175
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2342480
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