Title :
Solid-state lasers for frequency metrology
Author :
Kärtner, F.X. ; Mücke, O.D. ; Wagenblast, P. ; Ell, R. ; Winter, A. ; Kim, J. ; Siddiqui, A. ; Matos, L.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Massachusetts Inst. of Technol., Cambridge, MA, USA
Abstract :
The unique properties of solid-state laser materials such as ultrawide bandwidth and long upper-state lifetimes enable unique tools for frequency metrology. We report on recent progress in femtosecond laser frequency combs from octave-spanning Ti:sapphire lasers and single-frequency microchip lasers.
Keywords :
frequency measurement; high-speed optical techniques; measurement by laser beam; microchip lasers; femtosecond laser frequency combs; frequency metrology; long upper-state lifetimes materials; octave-spanning; sapphire lasers; single-frequency microchip lasers; solid-state laser materials; ultrawide bandwidth materials; Erbium-doped fiber lasers; Frequency; Metrology; Microchip lasers; Mirrors; Optical interferometry; Optical polarization; Semiconductor lasers; Solid lasers; Ultrafast optics;
Conference_Titel :
LEOS Summer Topical Meetings, 2005 Digest of the
Print_ISBN :
0-7803-8981-6
DOI :
10.1109/LEOSST.2005.1528005
