• DocumentCode
    2342600
  • Title

    Comparison of the beveled-edge and reach-through APD structures for PET applications

  • Author

    Paulus, Michael J. ; Rochelle, James M. ; Binkley, David M.

  • Author_Institution
    CTI PET Systems Inc., Knoxville, TN, USA
  • Volume
    4
  • fYear
    1994
  • fDate
    30 Oct-5 Nov 1994
  • Firstpage
    1864
  • Abstract
    The electrical characteristics of the beveled-edge and reach-through APD structures are theoretically and experimentally analyzed to determine which is most suitable for incorporation into a Positron Emission Tomography (PET) detector. The beveled edge structure is found to have a lower excess noise factor and lower dark current, leading to a superior signal-to-noise ratio. The reach-through structure is found to have a lower operating voltage and faster speed of response. Because signal-to-noise ratio is fundamentally important to achieving the energy and timing resolutions required for PET detectors, we believe the beveled-edge Structure is more appropriate than the reach-through structure for PET applications. This finding is experimentally verified by comparing the performance of several commercially available beveled-edge and reach-through APDs
  • Keywords
    avalanche photodiodes; biomedical equipment; gamma-ray detection; positron emission tomography; semiconductor process modelling; silicon radiation detectors; PET applications; PET detector; Si; beveled-edge; electrical characteristics; energy; faster speed of response; lower dark current; lower excess noise factor; operating voltage; reach-through APD structures; signal-to-noise ratio; superior signal-to-noise ratio; timing resolutions; Application software; Dark current; Detectors; Energy resolution; Manufacturing; Numerical analysis; Positron emission tomography; Signal to noise ratio; Timing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference, 1994., 1994 IEEE Conference Record
  • Conference_Location
    Norfolk, VA
  • Print_ISBN
    0-7803-2544-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1994.474702
  • Filename
    474702