DocumentCode :
2342735
Title :
Selection of best bases for classification and regression
Author :
Coifman, Ronald R. ; Saito, Naoki
Author_Institution :
Dept. of Math., Yale Univ., New Haven, CT, USA
fYear :
1994
fDate :
27-29 Oct 1994
Firstpage :
51
Abstract :
We describe extensions to the “best-basis” method to select orthonormal bases suitable for signal classification (or regression) problems from a collection of orthonormal bases using the relative entropy (or regression errors). Once these bases are selected, the most significant coordinates are fed into a traditional classifier (or regression method) such as linear discriminant analysis (LDA) or a classification and regression tree (CART). The performance of these statistical methods is enhanced since the proposed methods reduce the dimensionality of the problems by using the basis functions which are well-localized in the time-frequency plane as feature extractors
Keywords :
entropy; error analysis; feature extraction; signal processing; statistical analysis; basis functions; best-basis method; classification and regression tree; coordinates; feature extractors; linear discriminant analysis; orthonormal bases; performance; regression errors; regression method; relative entropy; signal classification; signal regression; statistical methods; time-frequency plane; Binary trees; Classification tree analysis; Cost function; Dictionaries; Energy measurement; Entropy; Linear discriminant analysis; Regression tree analysis; Time frequency analysis; Wavelet packets;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Theory and Statistics, 1994. Proceedings., 1994 IEEE-IMS Workshop on
Conference_Location :
Alexandria, VA
Print_ISBN :
0-7803-2761-6
Type :
conf
DOI :
10.1109/WITS.1994.513882
Filename :
513882
Link To Document :
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