DocumentCode :
2342805
Title :
Proceedings 10th Asian Test Symposium
fYear :
2001
fDate :
19-21 Nov. 2001
Abstract :
The following topics are dealt with: design for testability; fault modeling; fault diagnosis; ATPG; embedded memory test; Iddq test; test compaction; memory test pattern generation; virtual tester; beam testing; SOC test; delay test; FSM; fault injection; analog test; fault tolerance; BIST; analog/mixed signal test; verification; test scheduling; and DFT.
Keywords :
application specific integrated circuits; automatic test pattern generation; delays; design for testability; fault diagnosis; fault simulation; fault tolerance; finite state machines; formal verification; integrated circuit testing; logic testing; mixed analogue-digital integrated circuits; scheduling; ATPG; FSM; I/sub ddq/ test; SOC test; analog test; beam testing; delay test; design for testability; embedded memory test; fault diagnosis; fault injection; fault modeling; fault tolerance; memory test pattern generation; mixed signal test; test compaction; test scheduling; verification; virtual tester;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2001. Proceedings. 10th Asian
Conference_Location :
Kyoto, Japan
ISSN :
1081-7735
Print_ISBN :
0-7695-1378-6
Type :
conf
DOI :
10.1109/ATS.2001.990249
Filename :
990249
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2342805
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