DocumentCode :
2342812
Title :
Low inductance, explosion robust IGBT modules in high power inverter applications
Author :
Schnur, Lance ; Debled, Gilles ; Dewar, Steve ; Marous, John
Author_Institution :
ADtranz Transp. Inc., West Mifflin, PA, USA
Volume :
2
fYear :
1998
fDate :
12-15 Oct. 1998
Firstpage :
1056
Abstract :
Inverters in the MW class can greatly benefit from the use of IGBT modules with low internal inductance and with resistance to the effects of catastrophic explosions. The flat low inductance package (FLIP(R)) technology enables production of high power IGBT modules from 1800 A, 1800 V to 1200 A, 3300 V with an internal inductance as low as 3 nH. This represents an improvement of a factor of 2 compared to conventional modules at this power level. This is particularly important in high current, fast switching applications in order to minimize voltage overshoots during turn on and turn off and therefore to reduce the voltage overhead needed in silicon for a given DC link voltage. In addition, the FLIP(R)´s new terminal arrangement enables an improved high power inverter construction, which results in a total parasitic inductance of only 40 nH for an inverter in the MW range. An additional problem with the application of high power inverters in the MW range is the behaviour of the packaging under catastrophic failure conditions. Typically, failure of conventional modules can result in particles being emitted from the module, which involves risk of busbar shorts and causes significant mechanical damage to the busbar structures and gate circuitry. The FLIP(R) packaging is designed to avoid emission of metal parts under such conditions, which will limit mechanical damage and make repair less costly and time consuming.
Keywords :
busbars; inductance; insulated gate bipolar transistors; invertors; modules; power bipolar transistors; switching circuits; 1200 to 1800 A; 1800 to 3300 V; DC link voltage; FLIP technology; busbar shorts; catastrophic explosions; catastrophic failure; explosion robust IGBT modules; fast switching applications; flat low inductance package; gate circuitry; high current; high power IGBT modules; high power inverter; low internal inductance; mechanical damage; packaging; terminal arrangement; total parasitic inductance; turn off; turn on; voltage overshoots minimisation; Circuits; Explosions; Inductance; Insulated gate bipolar transistors; Inverters; Packaging; Production; Robustness; Silicon; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 1998. Thirty-Third IAS Annual Meeting. The 1998 IEEE
Conference_Location :
St. Louis, MO, USA
ISSN :
0197-2618
Print_ISBN :
0-7803-4943-1
Type :
conf
DOI :
10.1109/IAS.1998.730277
Filename :
730277
Link To Document :
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