Title :
Proceedings of the 1st European Test Conference (IEEE Cat. No.89CH2696-3)
Abstract :
The following topics were dealt with: pseudo-random test patterns; use of design hierarchy in testing; high-performance ATE/DUT interfaces; boundary-scan; fault cover prediction using testability measures; defect analysis and modelling; advanced diagnostic systems for ICs; test generation; PCB testing; testable regular structures; aliasing in signature analysis; CAE-ATE interfaces; and BIST structures
Keywords :
CAD/CAM; automatic test equipment; automatic testing; circuit CAD; computer interfaces; integrated circuit testing; logic analysers; printed circuit testing; production testing; ATE/DUT interfaces; BIST; CAE; PCB testing; aliasing; boundary-scan; defect analysis; design hierarchy; fault cover prediction; pseudo-random test patterns; signature analysis; test generation; testability;
Conference_Titel :
European Test Conference, 1989., Proceedings of the 1st
Conference_Location :
Paris, France
Print_ISBN :
0-8186-1937-6
DOI :
10.1109/ETC.1989.36210
