Faulty resistance sectioning technique for resistive bridging fault ATPG systems

This paper proposes a bridging fault resistance sectioning technique for high speed generation systems of test sets which detect all the resistive bridging faults detectable by logic testing, targeting all the resistive bridging faults each of which ranges from zero ohm to infinity resistance. The previously proposed ATPG systems for this problem dealt with each bridging fault as a target fault for test generation, and consequently the systems must have handled "set operations on the number space", which made the test generation algorithm very complicated and the fault simulation time-consuming. To solve these problems, our method partitions each bridging fault which ranges from zero ohm to infinity resistance into mutually exclusive subsections by a partitioning procedure, and deals with each subsection as a target fault in ATPG. This faulty resistance sectioning technique allows us to exclude the "set operations on the number space" from ATPG procedures, and leads to a simple and high speed ATPG system