A P1500 compliant BIST-based approach to embedded RAM diagnosis

Author

Appello, D. ; Corno, E. ; Giovinetto, M. ; Rebaudengo, M. ; Reorda, M. Sonza

fYear

2001

fDate

2001

Firstpage

97

Lastpage

102

Abstract

This paper deals with the diagnosis of faulty embedded RAMs and outlines the solution which is currently under evaluation within STMicroelectronics. The proposed solution exploits a BIST module implementing a March algorithm, defines a wrapper allowing its interface with a TAP controller, and describes a diagnostic procedure running in the external ATE software environment. The approach allows one to test multiple modules in the same chip through a single TAP interface and is compliant with the proposed P1500 standard for Embedded Core Test. Some preliminary experimental results gathered using a sample circuit are reported, showing the effectiveness of the proposed solution in terms of area and time requirements

Keywords

VLSI; automatic test software; built-in self test; fault diagnosis; integrated circuit testing; integrated memory circuits; logic testing; measurement standards; random-access storage; BIST module; March algorithm; P1500 compliant BIST-based approach; P1500 standard compliance; STMicroelectronics; TAP controller interfacing; diagnostic procedure; embedded RAM diagnosis; embedded core test standard; external ATE software environment; faulty embedded RAMs; multiple modules testing; Algorithm design and analysis; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Fault diagnosis; Manufacturing processes; Performance analysis; Production; Read-write memory;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 2001. Proceedings. 10th Asian

Conference_Location

Kyoto

ISSN

1081-7735

Print_ISBN

0-7695-1378-6

Type

conf

DOI

10.1109/ATS.2001.990266

Filename

990266