DocumentCode :
2343066
Title :
Cerberus: hierarchical DFT rule checker
Author :
Knopf, Reinhard ; Trischler, Erwin
Author_Institution :
Siemens AG, Munich, West Germany
fYear :
1989
fDate :
12-14 Apr 1989
Firstpage :
58
Lastpage :
62
Abstract :
The hierarchical design for testability (DFT) rule checker Cerberus has been developed to handle hierarchical circuits supporting a variety of scan structures with different types of scannable storage devices. Cerberus utilizes a general approach to testability rule checking and is part of a computer-aided engineering system to integrate design and test. Cerberus consists of the following components: an extractor to provide a levelized directed graph representation from a circuit netlist, a preprocessor to provide acyclic graphs and for topological sorting of circuit nodes, a rule checker nucleus to perform the DFT verification process hierarchically, and a protocol generator to output the rule-checker results in a user-friendly representation
Keywords :
VLSI; automatic testing; circuit CAD; directed graphs; logic testing; ASIC; Cerberus; VLSI; acyclic graphs; automatic testing; computer-aided engineering; design/test integration; hierarchical circuits; hierarchical design for testability; levelized directed graph; preprocessor; protocol generator; scan structures; scannable storage devices; testability rule checking; topological sorting; verification; Circuit testing; Clocks; Computer aided engineering; Delay; Design for testability; Law; Legal factors; Logic; Sequential analysis; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
European Test Conference, 1989., Proceedings of the 1st
Conference_Location :
Paris
Print_ISBN :
0-8186-1937-6
Type :
conf
DOI :
10.1109/ETC.1989.36220
Filename :
36220
Link To Document :
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