Title :
Design of a digitalized burn-in test plant
Author :
Hwu, K.I. ; Chen, Y.H.
Author_Institution :
Center for Power Electron. Technol., Nat. Taipei Univ. of Technol., Taipei
Abstract :
A burn-in test plant with multiple inputs having a wide range of input voltages is proposed herein, whose controller is realized by a digital signal processor (DSP). By means of DSP, data monitoring and command setting are easy to realize. First of all, the details of the proposed circuit topology and the corresponding control strategy are presented, and secondly some experimental results are provided to verify the proposed burn-in test plant.
Keywords :
digital signal processing chips; integrated circuit testing; network topology; circuit topology; command setting; data monitoring; digital signal processor; digitalized burn-in test plant; Circuit testing; DC-DC power converters; Digital signal processors; Electronic equipment testing; Power electronics; Power supplies; Signal design; Switches; Topology; Voltage;
Conference_Titel :
Sustainable Energy Technologies, 2008. ICSET 2008. IEEE International Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-1887-9
Electronic_ISBN :
978-1-4244-1888-6
DOI :
10.1109/ICSET.2008.4747043
