CMOS open defect detection based on supply current in time-variable electric field and supply voltage application

Author

Hashizume, Masaki ; Ichimiya, Masahiro ; Yotsuyanagi, Hiroyuki ; Tamesada, Takeomi

Author_Institution

Fac. of Eng., Tokushima Univ., Japan

fYear

2001

fDate

2001

Firstpage

117

Lastpage

122

Abstract

In this paper, a new test method is proposed for detecting open defects in CMOS ICs. The method is based on supply current of ICs generated by applying time-variable supply voltage and electric field from the outside of the ICs. The feasibility of the test is examined by some experiments. The empirical results show that, by using the method, open defects in CMOS ICs can be detected. Also, the test input vectors for the test method are proposed and it is shown that they can be generated more easily than functional test methods based on stuck-at fault models

Keywords

CMOS logic circuits; automatic testing; fault diagnosis; integrated circuit testing; logic testing; CMOS; logic ICs; open defect detection; supply current; supply voltage application; test input vectors; test method; time-variable electric field; Circuit faults; Circuit testing; Current supplies; Delay; Electrical fault detection; Fault detection; Integrated circuit modeling; Integrated circuit testing; Semiconductor device modeling; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 2001. Proceedings. 10th Asian

Conference_Location

Kyoto

ISSN

1081-7735

Print_ISBN

0-7695-1378-6

Type

conf

DOI

10.1109/ATS.2001.990269

Filename

990269