Title :
Memory read faults: taxonomy and automatic test generation
Author :
Benso, Alfredo ; Di Carlo, Stefano ; Di Natale, Giorgio ; Prinetto, P.
Author_Institution :
Dipt. di Automatica a Informatica, Politecnico di Torino, Italy
Abstract :
This paper presents an innovative algorithm for the automatic generation of March tests. The proposed approach is able to generate an optimal March test for an unconstrained set of memory faults in very low computation time. Moreover, we propose a new complete taxonomy for memory read faults, a class of faults never carefully addressed in the past
Keywords :
automatic test pattern generation; integrated circuit testing; integrated memory circuits; logic testing; ATPG; March tests generation; automatic test generation; low computation time; memory read faults; optimal March test; read faults taxonomy; unconstrained memory fault set; Automatic testing; Availability; Circuit faults; Circuit testing; Fault detection; Power supplies; Production; Random access memory; Taxonomy; World Wide Web;
Conference_Titel :
Test Symposium, 2001. Proceedings. 10th Asian
Conference_Location :
Kyoto
Print_ISBN :
0-7695-1378-6
DOI :
10.1109/ATS.2001.990275
