• DocumentCode
    23433
  • Title

    Ion Energy and Angular Distributions in a Dual-Frequency Capacitively Coupled Chlorine Discharge

  • Author

    Shuo Huang ; Gudmundsson, J.T.

  • Author_Institution
    Univ. of Michigan-SJTU Joint Inst., Shanghai Jiao Tong Univ., Shanghai, China
  • Volume
    42
  • Issue
    10
  • fYear
    2014
  • fDate
    Oct. 2014
  • Firstpage
    2854
  • Lastpage
    2855
  • Abstract
    Ion energy distributions (IEDs) and ion angular distributions (IADs) of Cl2+ and Cl+ ions in a dual-frequency capacitively coupled chlorine discharge are obtained through a particle-in-cell/Monte Carlo simulation. Since the ion transit time is less than the low-frequency period, the ions respond to the instantaneous electric field in the sheath region, which leads to bimodal IEDs for Cl2+ and Cl+ ions. When transiting the sheath, the Cl+ ions experience a more collisional sheath than the Cl2+ ions. The IADs of Cl2+ and Cl+ ions at the surface are almost anisotropic. However, a secondary peak is found in the IAD of Cl+ ions, which can be ascribed to dissociative ionization reactions.
  • Keywords
    Monte Carlo methods; chlorine; high-frequency discharges; ionisation; plasma collision processes; plasma sheaths; plasma simulation; plasma transport processes; positive ions; Cl2+; Cl+; collisional sheath; dissociative ionization reactions; dual-frequency capacitively coupled chlorine discharge; instantaneous electric field; ion angular distributions; ion energy distribution; ion transit time; low-frequency period; particle-in-cell-Monte Carlo simulation; secondary peak; sheath region; Discharges (electric); Educational institutions; Fault location; Ions; Plasmas; Surface treatment; Capacitively coupled plasma (CCP); ion angular distribution (IAD); ion energy distribution (IED); particle-in-cell (PIC) simulation; particle-in-cell (PIC) simulation.;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2014.2323816
  • Filename
    6822600