Title :
Debugging integrated circuits: AI can help
Author :
Marzouki, M. ; Courtois, B.
Author_Institution :
IMAG/TIM3 Lab., Grenoble, France
Abstract :
An overview of Pesticide, a Prolog-written expert system for integrated-circuit debugging is presented. Pesticide relies on the knowledge of structural and functional properties of both combinational and sequential ICs. Its external environment consists of a scanning electron microscope used in voltage contrast mode and linked to CAD tools. Particular attention is given to the modeling of the device under test, the strategies adopted for fault detection and localization within the circuit under test, and some simple execution examples
Keywords :
automatic test equipment; automatic testing; circuit CAD; combinatorial circuits; electronic engineering computing; expert systems; integrated circuit testing; integrated logic circuits; logic CAD; logic testing; scanning electron microscopy; sequential circuits; CAD tools; Pesticide; Prolog-written expert system; artificial intelligence; combinatorial ICs; fault detection; fault location; integrated-circuit debugging; scanning electron microscope; sequential ICs; voltage contrast mode; Artificial intelligence; Automatic testing; Circuit simulation; Circuit testing; Databases; Debugging; Diagnostic expert systems; Expert systems; System testing; Very large scale integration;
Conference_Titel :
European Test Conference, 1989., Proceedings of the 1st
Conference_Location :
Paris
Print_ISBN :
0-8186-1937-6
DOI :
10.1109/ETC.1989.36242
