Title :
Test generation for current testing
Author :
Nigh, Phil ; Maly, Wojciech
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie-Mellon Univ., Pittsburgh, PA, USA
Abstract :
Current testing has been found to be useful for testing CMOS ICs because it can detect a large class of manufacturing defects. The concept of current testing is described; the classes of defects detectable by current testing and the conditions to detect a given defect are described; and a general test-vector generation algorithm for current testing is developed and applied to two examples
Keywords :
CMOS integrated circuits; VLSI; automatic testing; fault location; integrated circuit testing; logic testing; CMOS ICs; IC testing; VLSI; automatic testing; current testing; logic testing; test-vector generation algorithm; CMOS technology; Circuit faults; Circuit noise; Circuit testing; Computer aided manufacturing; Current measurement; Monitoring; Semiconductor device modeling; Steady-state; Voltage;
Conference_Titel :
European Test Conference, 1989., Proceedings of the 1st
Conference_Location :
Paris
Print_ISBN :
0-8186-1937-6
DOI :
10.1109/ETC.1989.36243
