Title :
Fast test method for serial A/D and D/A converters
Author_Institution :
Philips Res. Lab., Eindhoven, Netherlands
Abstract :
An efficient test method for so-called serial analog/digital (A/D) and D/A converters which can be executed on digital automated test equipment is described. The method is applicable for stand-alone converters and for mixed-signal devices containing this type of converters. The proposed solution makes use of some special properties of serial converters. The method consists of a measurement of the output quantity at a number of stationary inputs, distributed over a full input range. The static transfer curve is determined by a number of DC measurements. An accurate DC source is required for testing the sigma-delta modulators, and a low-speed digitizer is needed for the serial D/A. In addition, simple computations must be performed on the acquired data (Fourier transforms are not necessary). A reduction of test time and computational effort is claimed, still giving sufficient information on gain, offset, noise and distortion
Keywords :
analogue-digital conversion; automatic test equipment; digital instrumentation; digital-analogue conversion; electronic equipment testing; A/D converters; ATE; D/A converters; DC measurements; digital automated test equipment; distortion; gain; low-speed digitizer; mixed-signal devices; noise; offset; output quantity; serial converters; sigma-delta modulators; static transfer curve; test method; test time; Analog-digital conversion; Circuit testing; Delta-sigma modulation; Digital filters; Digital integrated circuits; Digital modulation; Integrated circuit testing; Laboratories; Noise reduction; Very large scale integration;
Conference_Titel :
European Test Conference, 1989., Proceedings of the 1st
Conference_Location :
Paris
Print_ISBN :
0-8186-1937-6
DOI :
10.1109/ETC.1989.36252