The testability of a modified Booth multiplier

The author describes the generation of the test view of a multiplier-accumulator based on a modified Booth algorithm. It is shown that an algorithm can be found that rapidly generates the test patterns as a function of the parameters of the module. The fault model used is an extension of the traditional stuck-at model switch-level faults occurring in pass transistor logic. To achieve full testability, only slight modifications on the hardware of the multiplier-accumulator are necessary. It is possible to generate a set of test patterns that is independent of the size of the multiplier-accumulator