• DocumentCode
    2343648
  • Title

    A memristor-based memory cell using ambipolar operation

  • Author

    Junsangsri, Pilin ; Lombardi, Fabrizio

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
  • fYear
    2011
  • fDate
    9-12 Oct. 2011
  • Firstpage
    148
  • Lastpage
    153
  • Abstract
    This paper presents a novel memory cell consisting of a memristor and ambipolar transistors. Macroscopic models are utilized to characterize the operations of this memory cell. A detailed treatment of the two basic memory operations (write and read) with respect to memristor features is provided; particular, emphasis is devoted to the threshold characterization of the memristance and the on/off states. Extensive simulation results are provided to assess performance in terms of the write/read times, transistor scaling and power dissipation. The simulation results show that the proposed memory cell achieves superior performance compared with other memristor-based cells found in the technical literature.
  • Keywords
    MOSFET; memristors; random-access storage; semiconductor device models; MOSFET; RAM; ambipolar operation; ambipolar transistors; macroscopic model; memristance; memristor-based memory cell simulation; on-off states; power dissipation; threshold characterization; transistor scaling; write-read times; CMOS integrated circuits; Logic gates; MOS devices; Memristors; Random access memory; Resistance; Transistors; Ambipolar Transistor; Emerging Technology; Memory Cell; Memristor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design (ICCD), 2011 IEEE 29th International Conference on
  • Conference_Location
    Amherst, MA
  • ISSN
    1063-6404
  • Print_ISBN
    978-1-4577-1953-0
  • Type

    conf

  • DOI
    10.1109/ICCD.2011.6081390
  • Filename
    6081390