DocumentCode
2343648
Title
A memristor-based memory cell using ambipolar operation
Author
Junsangsri, Pilin ; Lombardi, Fabrizio
Author_Institution
Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
fYear
2011
fDate
9-12 Oct. 2011
Firstpage
148
Lastpage
153
Abstract
This paper presents a novel memory cell consisting of a memristor and ambipolar transistors. Macroscopic models are utilized to characterize the operations of this memory cell. A detailed treatment of the two basic memory operations (write and read) with respect to memristor features is provided; particular, emphasis is devoted to the threshold characterization of the memristance and the on/off states. Extensive simulation results are provided to assess performance in terms of the write/read times, transistor scaling and power dissipation. The simulation results show that the proposed memory cell achieves superior performance compared with other memristor-based cells found in the technical literature.
Keywords
MOSFET; memristors; random-access storage; semiconductor device models; MOSFET; RAM; ambipolar operation; ambipolar transistors; macroscopic model; memristance; memristor-based memory cell simulation; on-off states; power dissipation; threshold characterization; transistor scaling; write-read times; CMOS integrated circuits; Logic gates; MOS devices; Memristors; Random access memory; Resistance; Transistors; Ambipolar Transistor; Emerging Technology; Memory Cell; Memristor;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Design (ICCD), 2011 IEEE 29th International Conference on
Conference_Location
Amherst, MA
ISSN
1063-6404
Print_ISBN
978-1-4577-1953-0
Type
conf
DOI
10.1109/ICCD.2011.6081390
Filename
6081390
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