Title :
Faults in processor control subsystems: testing correctness and performance faults in the data prefetching unit
Author :
Almukhaizim, Sobeeh ; Petrov, Peter ; Orailoglu, Alex
Author_Institution :
Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
Abstract :
The processor control subsystems have for a long time been recognized as a bottleneck in the process of achieving complete fault coverage through various functional test propagation approaches. The difficult-to-test corner cases are further accentuated in fault-resilient control subsystems as no functional effect is incurred as a result of the fault, even though performance suffers. We investigate the construction of software programs, capable of providing full fault coverage at minimal hardware cost, for one such fault resilient subsystem in processor architecture: the data prefetching unit. Experimental results confirm the efficacy of the proposed method
Keywords :
automatic test pattern generation; built-in self test; design for testability; fault diagnosis; integrated circuit testing; microprocessor chips; data prefetching unit; difficult-to-test corner cases; fault coverage; fault-resilient control subsystems; full fault coverage; functional test propagation approaches; hardware cost; processor architecture; processor control subsystems; software programs; Buffer storage; Computer science; Control systems; Costs; Data engineering; Delay; Design for testability; Hardware; Prefetching; System testing;
Conference_Titel :
Test Symposium, 2001. Proceedings. 10th Asian
Conference_Location :
Kyoto
Print_ISBN :
0-7695-1378-6
DOI :
10.1109/ATS.2001.990303