• DocumentCode
    2343692
  • Title

    Aliasing errors in multiple input signature analysis registers

  • Author

    Williams, T.W. ; Daehn, W.

  • Author_Institution
    IBM Corp., Boulder, CO, USA
  • fYear
    1989
  • fDate
    12-14 Apr 1989
  • Firstpage
    338
  • Lastpage
    345
  • Abstract
    Aliasing errors in linear feedback shift registers used as multiple-input signature-analysis registers (MISARs) for self-testing networks are investigated analytically. The authors derive the final value for aliasing errors for a MISAR with the same probability of an error on each of the different inputs. They also derive the final value for aliasing with the same register if there are different probability values of an error on each of the different inputs. This analysis assumes that the different inputs are all independent of one another. The analysis is based on the Markov model. In either case, the final value is shown to be 1/2k where k is the length of the shift register
  • Keywords
    Markov processes; error analysis; logic analysers; logic testing; probability; shift registers; Markov model; aliasing errors; linear feedback shift registers; logic testing; multiple input signature analysis registers; probability; self-testing networks; Built-in self-test; Feeds; Linear feedback shift registers; Logic design; Logic testing; Sequential analysis; Shift registers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    European Test Conference, 1989., Proceedings of the 1st
  • Conference_Location
    Paris
  • Print_ISBN
    0-8186-1937-6
  • Type

    conf

  • DOI
    10.1109/ETC.1989.36261
  • Filename
    36261