DocumentCode
2343692
Title
Aliasing errors in multiple input signature analysis registers
Author
Williams, T.W. ; Daehn, W.
Author_Institution
IBM Corp., Boulder, CO, USA
fYear
1989
fDate
12-14 Apr 1989
Firstpage
338
Lastpage
345
Abstract
Aliasing errors in linear feedback shift registers used as multiple-input signature-analysis registers (MISARs) for self-testing networks are investigated analytically. The authors derive the final value for aliasing errors for a MISAR with the same probability of an error on each of the different inputs. They also derive the final value for aliasing with the same register if there are different probability values of an error on each of the different inputs. This analysis assumes that the different inputs are all independent of one another. The analysis is based on the Markov model. In either case, the final value is shown to be 1/2k where k is the length of the shift register
Keywords
Markov processes; error analysis; logic analysers; logic testing; probability; shift registers; Markov model; aliasing errors; linear feedback shift registers; logic testing; multiple input signature analysis registers; probability; self-testing networks; Built-in self-test; Feeds; Linear feedback shift registers; Logic design; Logic testing; Sequential analysis; Shift registers;
fLanguage
English
Publisher
ieee
Conference_Titel
European Test Conference, 1989., Proceedings of the 1st
Conference_Location
Paris
Print_ISBN
0-8186-1937-6
Type
conf
DOI
10.1109/ETC.1989.36261
Filename
36261
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