DocumentCode :
2343692
Title :
Aliasing errors in multiple input signature analysis registers
Author :
Williams, T.W. ; Daehn, W.
Author_Institution :
IBM Corp., Boulder, CO, USA
fYear :
1989
fDate :
12-14 Apr 1989
Firstpage :
338
Lastpage :
345
Abstract :
Aliasing errors in linear feedback shift registers used as multiple-input signature-analysis registers (MISARs) for self-testing networks are investigated analytically. The authors derive the final value for aliasing errors for a MISAR with the same probability of an error on each of the different inputs. They also derive the final value for aliasing with the same register if there are different probability values of an error on each of the different inputs. This analysis assumes that the different inputs are all independent of one another. The analysis is based on the Markov model. In either case, the final value is shown to be 1/2k where k is the length of the shift register
Keywords :
Markov processes; error analysis; logic analysers; logic testing; probability; shift registers; Markov model; aliasing errors; linear feedback shift registers; logic testing; multiple input signature analysis registers; probability; self-testing networks; Built-in self-test; Feeds; Linear feedback shift registers; Logic design; Logic testing; Sequential analysis; Shift registers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
European Test Conference, 1989., Proceedings of the 1st
Conference_Location :
Paris
Print_ISBN :
0-8186-1937-6
Type :
conf
DOI :
10.1109/ETC.1989.36261
Filename :
36261
Link To Document :
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