Title :
A hybrid artificial immune classifier based on weighting attributes and fuzzy clustering
Author :
Li, Gang ; Zhuang, Jian ; Hou, Hongning ; Yu, Dehong
Author_Institution :
Sch. of Mech. Eng., Xi´´an Jiaotong Univ., Xi´´an
Abstract :
Inspired by complementary strategies, a hybrid supervised artificial immune classifier is put forward, which is on the basis of the clonal selection principle, and combined with the fuzzy c-means clustering (FCM) algorithm and information entropy theory. The new approach uses a weighted Euclidean distance based dissimilarity measure during all affinity evaluations. With the help of FCM clustering, the initial antibodies that image features of data set are extracted effectively, and then a clonal selection algorithm named CLONALG is adopted for each training instance to constitute the memory cells. Finally, classification is performed in a k-nearest neighbor approach with the developed set of memory cells. Experimental results on five benchmark datasets from UCI machine learning repository demonstrate the effectiveness of the algorithm as a classification technique. Compared with generic CLOALG artificial immune classifiers, the hybrid classifier not only can decrease the computational time, but also can achieve higher classification accuracy.
Keywords :
artificial immune systems; entropy; feature extraction; fuzzy set theory; image classification; learning (artificial intelligence); pattern clustering; FCM algorithm; affinity evaluation; clonal selection principle; feature extraction; fuzzy c-means clustering; hybrid supervised artificial immune classifier; image classification; information entropy theory; k-nearest neighbor approach; machine learning; weighted Euclidean distance based dissimilarity measure; weighted attribute; Artificial immune systems; Classification algorithms; Clustering algorithms; Data mining; Fuzzy systems; Immune system; Information entropy; Machine learning algorithms; Testing; Training data; clonal selection; data classification; entropy weight; fuzzy c-means; supervised learning;
Conference_Titel :
Industrial Electronics and Applications, 2009. ICIEA 2009. 4th IEEE Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-2799-4
Electronic_ISBN :
978-1-4244-2800-7
DOI :
10.1109/ICIEA.2009.5138863