DocumentCode :
2343707
Title :
Robust dead-beat current control for PWM rectifiers and active filters
Author :
Malesani, L. ; Mattavelli, P. ; Buso, S.
Author_Institution :
Dept. of Electr. Eng., Padova Univ., Italy
Volume :
2
fYear :
1998
fDate :
12-15 Oct. 1998
Firstpage :
1377
Abstract :
The paper analyses the stability limitations of the digital dead-beat current control applied to voltage-source three-phase converters used as PWM rectifiers and/or active filters. In these applications the conventional control algorithm, as used in drive applications, is not sufficiently robust and stability problems may arise for the current control loop. The current loop is, indeed, particularly sensitive to any model mismatch and to the possibly incorrect identification of the model parameters. A detailed analysis of the stability limitations of the commonly adopted dead-beat algorithm, based on a discrete-time state space model of the controlled system, is presented. A modified line voltage estimation technique is proposed, which increases the control´s robustness to parameter mismatches. The results of the theoretical analysis and the validity of the proposed modification to the control strategy are finally verified both by simulations and by experimental tests.
Keywords :
PWM power convertors; active filters; digital control; electric current control; parameter estimation; rectifying circuits; robust control; stability; PWM rectifiers; active filters; current control loop; digital dead-beat current control; discrete-time state space model; incorrect parameter identification; modified line voltage estimation technique; parameter mismatches robustness; robust dead-beat current control; stability limitations analysis; voltage-source three-phase converters; Active filters; Algorithm design and analysis; Current control; Pulse width modulation; Pulse width modulation converters; Rectifiers; Robust control; Robust stability; Stability analysis; State-space methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 1998. Thirty-Third IAS Annual Meeting. The 1998 IEEE
Conference_Location :
St. Louis, MO, USA
ISSN :
0197-2618
Print_ISBN :
0-7803-4943-1
Type :
conf
DOI :
10.1109/IAS.1998.730323
Filename :
730323
Link To Document :
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