Title :
The use of a test specification format in automatic test program generation
Author_Institution :
Philips Res. Lab., Eindhoven, Netherlands
Abstract :
Test specifications formats (TSFs) to facilitate standardization of testing information on ICs and circuit boards are examined. The author describes the application areas of a TSF and shows the practical use of one particular TSF, the neutral code format (NCF) proposed by C. Mortensen (1987). By writing a translator from NCF to a test programming language, it was seen that automatic test program generation is possible. It is found, however, that only GO/NOGO test programs could be generated
Keywords :
automatic programming; automatic test equipment; automatic testing; integrated circuit testing; printed circuit testing; program interpreters; CAD/testing integration; GO/NOGO test programs; ICs; PCB; automatic test program generation; neutral code format; standardization; test programming language; test specification format; translator; Automatic testing; Circuit testing; Digital integrated circuits; Electronic equipment testing; Integrated circuit testing; Laboratories; Performance evaluation; Printed circuits; Software packages; Software testing;
Conference_Titel :
European Test Conference, 1989., Proceedings of the 1st
Conference_Location :
Paris
Print_ISBN :
0-8186-1937-6
DOI :
10.1109/ETC.1989.36264
