Title :
Separating timing, data, and format in a tester-independent waveform representation
Author :
Lunde, Ron ; Faust, Mark
Author_Institution :
TSSI, Beaverton, OR, USA
Abstract :
The authors describe a tester-independent representation for digital waveforms which permits the separate manipulation of timing, data and format. This object-oriented approach is compact, extensible, and independent of tester architecture while still permitting the representation of a variety of tester featured such as multiclock modes, multiplex modes, and midcycle I/O transitions. Several examples illustrate transformations which can be performed on this representation while preserving the original waveforms. Also included is a short discussion of implementation experience and space requirements
Keywords :
automatic test equipment; automatic testing; electronic equipment testing; waveform analysis; ATE; automatic testing; digital waveforms; midcycle I/O transitions; multiclock modes; multiplex modes; object-oriented approach; tester-independent waveform representation; transformations; Compaction; Digital systems; Modems; Object oriented modeling; Test equipment; Testing; Timing;
Conference_Titel :
European Test Conference, 1989., Proceedings of the 1st
Conference_Location :
Paris
Print_ISBN :
0-8186-1937-6
DOI :
10.1109/ETC.1989.36266
