DocumentCode
2343790
Title
A study on relating redundancy removal in classical circuits to reversible mapping
Author
Sultana, Sayeeda ; Radecka, Katarzyna ; Pang, Yu
Author_Institution
Dept. of Electr. & Electron. Eng., McGill Univ., Montreal, QC, Canada
fYear
2011
fDate
9-12 Oct. 2011
Firstpage
206
Lastpage
211
Abstract
We present a way of synthesis of reversible circuits using redundant faults information obtained with the aid of its classical counterpart. We use Toffoli-based modules of classical standard gates and technology mapping to relate the effect of redundant stuck-at-value fault in classical irreversible gate level circuits and their reversible implementation. The simplified form of such Toffoli modules is proposed considering any fixed values of input signals (corresponding to stuck-at value effects). We also present redundant gates removal in reversible mapping.
Keywords
fault diagnosis; logic circuits; logic gates; Toffoli-based module; classical irreversible gate level circuit; classical standard gate; redundant fault information; redundant gate removal; redundant stuck-at-value fault; relating redundancy removal; reversible circuit; reversible mapping; technology mapping; Automatic test pattern generation; Circuit faults; Fault diagnosis; Logic gates; Minimization; Redundancy; Wires; Reversible logic; redundancy removal; synthesis;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Design (ICCD), 2011 IEEE 29th International Conference on
Conference_Location
Amherst, MA
ISSN
1063-6404
Print_ISBN
978-1-4577-1953-0
Type
conf
DOI
10.1109/ICCD.2011.6081398
Filename
6081398
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