Title :
Selecting a PRPG: randomness, primitiveness, or sheer luck?
Author :
Bayraktaroglu, Ismet ; Orailoglu, Alex
Author_Institution :
Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
Abstract :
The ability of randomness to constitute a quality measure in PRPG selection for logic BIST is investigated. Extensive correlation analyses performed on a rich set of pattern generators and benchmark circuits indicate that higher randomness is no guarantee of improved fault coverage in LFSM-based pseudo-random pattern generators. Further evaluation of fault coverage data indicates that the performance of PRPGs is dependent on both circuit particularities and the number of test patterns employed
Keywords :
automatic test pattern generation; automatic testing; built-in self test; combinational circuits; correlation methods; fault diagnosis; logic testing; sequential circuits; PRPG; benchmark circuits; circuit particularities; combinational circuits; correlation analyses; fault coverage; fault coverage data; logic BIST; pattern generators; primitiveness; pseudo-random pattern generators; quality measure; randomness; sequential circuits; test patterns; Benchmark testing; Built-in self-test; Circuit faults; Circuit testing; Computer science; Logic testing; Pattern analysis; Performance analysis; Test pattern generators; Time to market;
Conference_Titel :
Test Symposium, 2001. Proceedings. 10th Asian
Conference_Location :
Kyoto
Print_ISBN :
0-7695-1378-6
DOI :
10.1109/ATS.2001.990311
