Title :
Study of the dielectric Gaussian surface emissivity feature
Author :
Chen, Liang ; Yu, Yang ; Wang, David
Author_Institution :
Fac. of Inf. Sci. & Eng., Northeastern Univ., Shenyang
Abstract :
This paper introduces a study method of dielectric Gaussian surface emissivity based on the scattering feature. The rough surface model is established with the statistical parameters, and the scattering problem of model is calculated by small perturbation method. Consequently the dielectric Gaussian surface emissivity is obtained. Finally the rule of emissivity change is discussed.
Keywords :
Gaussian processes; dielectric materials; emissivity; dielectric Gaussian surface emissivity; perturbation method; rough surface model; scattering feature; statistical parameters; Density functional theory; Dielectrics; Information science; Perturbation methods; Rough surfaces; Scattering parameters; Statistics; Surface roughness; Surface waves; Temperature;
Conference_Titel :
Industrial Electronics and Applications, 2008. ICIEA 2008. 3rd IEEE Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-1717-9
Electronic_ISBN :
978-1-4244-1718-6
DOI :
10.1109/ICIEA.2008.4582675
