Title :
Multiple attractor cellular automata for hierarchical diagnosis of VLSI circuits
Author :
Sikdar, Biplab K. ; Ganguly, Niloy ; Karmakar, Aniket ; Chowdhury, Subha Sankar ; Chaudhuri, P. Pal
Author_Institution :
Dept. of Comput. Sci. & Technol., Bengal Eng. Coll., Howrah, India
Abstract :
This paper uses the hierarchical structure of a VLSI circuit to design an efficient diagnosis scheme. A special class of non-group GF(2 p) CA referred to as multiple attractor cellular automata (MACH) is introduced to diagnose the faulty block of a circuit under test (CUT). The scheme employs significantly lesser memory and performs faster diagnosis than the existing methods reported so far. Experimental results validate the efficiency of the proposed scheme in terms of diagnostic resolution and execution speed along with significant reduction of memory
Keywords :
VLSI; automatic testing; cellular automata; fault diagnosis; integrated circuit testing; logic testing; VLSI circuits; circuit under test; diagnostic resolution; execution speed; faulty block; hierarchical diagnosis; multiple attractor cellular automata; nongroup GF(2p) CA; Automatic testing; Circuit faults; Circuit testing; Computer science; Design engineering; Dictionaries; Educational institutions; Fault diagnosis; Production; Very large scale integration;
Conference_Titel :
Test Symposium, 2001. Proceedings. 10th Asian
Conference_Location :
Kyoto
Print_ISBN :
0-7695-1378-6
DOI :
10.1109/ATS.2001.990314