Title :
A microcode-based memory BIST implementing modified march algorithm
Author :
Youn, Dongkyu ; Kim, Taehyung ; Park, Sungju
Author_Institution :
Dept. of Comput. Sci., Hanyang Univ., Kyunggi, South Korea
Abstract :
A new microcode-based BIST (built-in self test) circuitry for embedded memory components is proposed in this paper. The memory BIST implements march algorithms which are slightly modified by adopting DOF (degree of freedom) concept to detect ADOFs (address decoder open faults) on top of conventional stuck faults. Furthermore it is shown that the march BIST modified can capture a few NPSFs (neighborhood pattern sensitive faults) coupled with the cellular automata address generator and patterns. The microcode-based memory BIST proposed lends itself to performing different combinations of march and retention tests with less microcode storage than the other approaches
Keywords :
application specific integrated circuits; built-in self test; cellular automata; fault diagnosis; fault simulation; integrated circuit testing; logic testing; ADOFs; DOF; NPSFs; address decoder open faults; address generator; cellular automata; microcode-based memory BIST; modified march algorithm; neighborhood pattern sensitive faults; retention tests; stuck faults; Automatic testing; Built-in self-test; CMOS logic circuits; Circuit faults; Circuit testing; Computer science; Decoding; Fault detection; Logic arrays; Test pattern generators;
Conference_Titel :
Test Symposium, 2001. Proceedings. 10th Asian
Conference_Location :
Kyoto
Print_ISBN :
0-7695-1378-6
DOI :
10.1109/ATS.2001.990315
