A microcode-based memory BIST implementing modified march algorithm

Author

Youn, Dongkyu ; Kim, Taehyung ; Park, Sungju

Author_Institution

Dept. of Comput. Sci., Hanyang Univ., Kyunggi, South Korea

fYear

2001

fDate

2001

Firstpage

391

Lastpage

395

Abstract

A new microcode-based BIST (built-in self test) circuitry for embedded memory components is proposed in this paper. The memory BIST implements march algorithms which are slightly modified by adopting DOF (degree of freedom) concept to detect ADOFs (address decoder open faults) on top of conventional stuck faults. Furthermore it is shown that the march BIST modified can capture a few NPSFs (neighborhood pattern sensitive faults) coupled with the cellular automata address generator and patterns. The microcode-based memory BIST proposed lends itself to performing different combinations of march and retention tests with less microcode storage than the other approaches

Keywords

application specific integrated circuits; built-in self test; cellular automata; fault diagnosis; fault simulation; integrated circuit testing; logic testing; ADOFs; DOF; NPSFs; address decoder open faults; address generator; cellular automata; microcode-based memory BIST; modified march algorithm; neighborhood pattern sensitive faults; retention tests; stuck faults; Automatic testing; Built-in self-test; CMOS logic circuits; Circuit faults; Circuit testing; Computer science; Decoding; Fault detection; Logic arrays; Test pattern generators;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 2001. Proceedings. 10th Asian

Conference_Location

Kyoto

ISSN

1081-7735

Print_ISBN

0-7695-1378-6

Type

conf

DOI

10.1109/ATS.2001.990315

Filename

990315