• DocumentCode
    2343947
  • Title

    Combining a global SVM and local nearest-neighbor classifiers driven by local discriminative boundaries

  • Author

    Xiong, Wei ; Ong, S.H. ; Le, T.T. ; Lim, Joo Hwee ; Liu, Jiang ; Foong, Kelvin

  • Author_Institution
    Inst. for Infocomm Res., A-STAR, Singapore
  • fYear
    2009
  • fDate
    25-27 May 2009
  • Firstpage
    3597
  • Lastpage
    3600
  • Abstract
    Nonlinear support vector machines (SVMs) rely on the kernel trick and tradeoff parameters to build nonlinear models to classify complex problems and balance misclassification and generalization. The inconvenience in determining the kernel and the parameters has motivated the use of local nearest neighbor (NN) classifiers in lieu of global classifiers. This substitution ignores the advantage of SVM in global error minimization. On the other hand, the NN rule assumes that class conditional probabilities are locally constant. Such an assumption does not hold near class boundaries and in any high dimensional space due to the curse of dimensionality. We propose a hybrid classification method combining the global SVM and local NN classifiers. Local classifiers occur only when the global SVM is likely to fail. Furthermore, local NN classifiers adopt an adaptive metric driven by local SVM discriminative boundaries. Improved performance has been demonstrated compared to partially similar.
  • Keywords
    minimisation; pattern classification; probability; support vector machines; SVM; adaptive metric; global error minimization; local discriminative boundary; local nearest-neighbor classifier; nonlinear support vector machine; probability; Bayesian methods; Dentistry; Error analysis; Euclidean distance; Kelvin; Kernel; Nearest neighbor searches; Neural networks; Support vector machine classification; Support vector machines; Support vector machines; adaptive metric; boundary driven; combination; local; nearest neighbors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications, 2009. ICIEA 2009. 4th IEEE Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4244-2799-4
  • Electronic_ISBN
    978-1-4244-2800-7
  • Type

    conf

  • DOI
    10.1109/ICIEA.2009.5138876
  • Filename
    5138876